For the N2 adsorption-desorption an

For the N2 adsorption-desorption analysis, the unsupported
membranes were ground to form fine-powdered samples. N2
adsorption-desorption isotherms at 77 K were performed in
Micromeritics TriStar II 3020 equipment. The samples were previously
degassed, first at 90
C for 1 h and subsequently at 250
C for
5 h under N2 flow. The surface area values were obtained by
application of the BET equation. The calculation of the pore sizewas
performed by applying the NLDFT method. XRD patterns were
collected on a Rigaku MiniFlex diffractometer using Cu Ka radiation.
The XRD patterns, scanned with 2q values from 20
to 80
, were
obtained using a step size of 0.02
. TG-DTA analyses were performed
in a NETZSCH STA 449F3 instrument, heating the sample to
1100
C at a rate of 10
C/min under a 100 N mL/min air flow. The
surface microcosmic morphologies of the prepared membranes
were visualized with a field-emission scanning electron microscope
(FESEM), obtained with a Hitachi S4800 scanning microscope
operating at an accelerating voltage of 5 kV. Transmission electron
microscopy (TEM) analyses were performed on a JEOL 1011 microscope
operating at 200 kV. The particle size distribution of the
boehmite sols and the zeta potential of powders were characterized
by dynamic light scattering (DLS) in a Microtrac Zetatrac analyzer.
The temperature was kept constant at room temperature. The
refractive index of the g-alumina membranes fabricated on the
silicon substrates were measured with a J. A. Woollam Complete
EASE M2000U spectroscopic ellipsometer with a 632.8 nm laser
at a 70
incident angle [25].

結果 (中文) 1:

N2 吸附-解吸的分析，不受支持的膜是地面形成精细粉末样品。N2在进行了吸附-脱附等温线在 77 K药粉三星二 3020 设备。标本以前脱气，先在 90 C 为 1 h，随后在 250 CN2 流量下的 5 h。表面积值制得方程中的应用的赌注。计算的孔隙 sizewas术，采用 NLDFT 方法。X 射线衍射模式了在使用铜 Ka 辐射利用 MiniFlex 衍射仪上收集。X 射线衍射，扫描与从 20 到 80，2q 值了采用步进大小为 0.02。进行热重-差热分析在耐驰 STA 449F3 文书中，加热至样品10 C/min 下 100 N 毫升/分钟空气流动速度的 1100 C。的准备好膜的表面微观形貌被可视化与场发射扫描电子显微镜日立 S4800 扫描显微镜 (FESEM)，得到开工率 5 加速电压 kV。透射电镜 (TEM) 分析了日本电子 1011年显微镜运行在 200 千伏。颗粒大小分布薄水铝石溶胶和 zeta 电位的粉末进行了表征通过动态光散射 (DLS) 精密度 Zetatrac 分析仪中。在室温下保持温度不变。的g-氧化铝膜上制备出折射率J.A.伍拉姆完成测量硅衬底用 632.8 nm 激光缓解 M 2000U 椭偏光谱实验在 70 的入射角 [25]。

結果 (中文) 3:

为氮气吸附-解吸分析，不支持的细胞膜，形成细粉末样品。N2吸附-脱附等温线在77 K
在
微晶三星II 3020设备进行。以前的样品
脱气，首先在90
C 1小时，随后在250
C 5 H
氮气流量。通过对BET方程的应用，得到了表面积值。的孔径计算
采用NLDFT方法进行。XRD图
收集在Rigaku MHz衍射仪采用Cu Ka辐射。
XRD，扫描二值从20到80

，是
获得使用0.02
步长。TG-DTA分析
NETZSCH STA中449f3仪器，加热样品
1100
C在100毫升/分钟的空气流动率为10
C /分钟。所制备的膜的表面微观形貌进行

与场发射扫描电子显微镜（SEM），
可视化与日立s4800扫描显微镜
在加速电压5 kV运行了。透射电子显微镜（TEM）分析
在JEOL 1011显微镜进行
工作在200千伏。粒径分布的
勃姆石溶胶和Zeta电位的粉体进行表征
通过动态光散射（DLS）在microtrac zetatrac分析仪。
温度保持室温恒定。的
折射率的克-氧化铝复合膜的制备及其在
硅衬底上进行一个完整的
j.a.伍拉姆缓解我 2000U光谱椭偏仪632.8 nm激光
在70
入射角[ 25 ]。