Generalized ellipsometry scattering tomography based on the traditional optical instrument developed Ellipsometer, is a new kind of optical instrument, its far-field measurement methods based on optical measurement technology. Nano-manufacturing process, achieve the crucial characteristics of non-contact, no damage, low cost, high efficiency, measurement of surface topography.Transmissive scatter tomography generalized ellipsometry in reflection type Ellipsometer based on further development of transmission-mode surface topography measurement of biological samples and other special materials.This brief description of scattering tomography measurement of generalized ellipsometry theory have transmission ellipsometry of optical structure design, location and analysis and other related work. Structural modeling using SolidWorks 2015 series software, force analysis by ansys15.0, based on actual measurement quality and simulate real work force.
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