As previously argued, this time can be notably reduced by using greater bus width. However, the platforms employed in this research did not permit the bus used to be expanded any further.
(b) In tests 5 and 6, total test time increased markedly (30% more) in comparison with the best performance, due to notable bus errors (theoretically, 25% of the bus was damaged). The consequent reduction in operative bus width meant that during CLB testing, the number of CLB tests that could be conducted simultaneously was reduced. In other words, the number of bitstreams was increased.