The application of TFT in monitors has attracted wide attention and attracted more and more research interest. In particular, amorphous zinc oxide (a-IGZO) thin-film transistors (TFTs) are of particular concern due to their outstanding performance, including high electron migration, excellent uniformity and stability, high light transmission, and low processing temperature and cost processing. However, most of the IGZO TFTs reported so far must be driven by large voltages to achieve high migration rates and a high on/off current ratio. Gate insulators play an important role in obtaining high-performance TFTs. SiO2 has been used as a gate insulator for conventional TFT. High-quality interface density and better electrical insulation. However, SiO2 as a low dielectric constant k tFT easy to lead to short channel effect, compared with the use of high k dielectric TFTs, the use of SiO2 as a dielectric material TFTs require higher driving voltage to achieve the same efficiency. The easiest way to reduce the drive voltage is to reduce the thickness of the gate dielectric layer.
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