In this paper, parametric degradation at end of life or at wear-out condition is analyzed using accelerated aging of aluminum electrolytic capacitors used at low pass filter stage in an inverter circuit.
The proposed microcontroller based intelligent life calculation technique eliminates the use
of costly instruments like impedance analyzers, thermal data logger and test beds having filter circuits to perform accelerated aging test and to manually implement the life calculation algorithm using theoretical calculus methods [3]-[4].