The X-ray diffraction peaks of Mo5S

The X-ray diffraction peaks of Mo5Si3 and Mo3Si were not observed after dry mixing, although those of Mo and MoSi2 were observed. Then, thin films were deposited on the alumina crucible substrate with a target of Mo5Si3 or Mo3Si thin film.

結果 (中文) 1:

干燥后未观察到的混合Mo5Si3和Mo3Si X射线衍射峰，而钼钼的观察。然后，沉积在一个Mo5Si3而言或Mo3Si薄膜靶的氧化铝坩埚基体薄膜。

結果 (中文) 2:

X 射线衍射峰的 Mo5Si3 和 Mo3Si 未观察干燥混合后，虽然那些 Mo 和 MoSi2 被观察到。然后，薄膜沉积的目标为 Mo5Si3 或 Mo3Si 薄膜的氧化铝坩埚基板上。