In view of the challenges in the state of the art, the present invention relates to the design of a low-voltage low-power SRAM device, using the read-, write-, hold-, and standby-assist as a whole for increasing the read stability, increasing the write margin, maintaining the hold margin, reducing the hold and standby leakage current, and/or increasing the operating speed at the same time. Embodiments of the present invention are directed to methods and apparatuses for read-, write-, hold-, and standby-assist voltage generation for static random access memory (SRAM) cells. Embodiments of the present invention lower the effective supply voltage for un-accessed rows of memory cells in the hold mode, increase the effective supply voltage for accessed memory cells in the active mode, and lower the effective supply voltage further for all the SRAM cells in the standby mode to achieve a solution for whole-time (active and standby) power reduction besides achieving the stability and noise margins. The effective supply voltage is defined as the voltage difference between the local power-supply voltage and the local source voltage of the memory cell.For embodiments wherein the SRAM cell receives read-, write-, hold-, and standby-assist voltages, the SRAM cell can be a conventional differential 6T cell with one power-supply line, one source-voltage line, one word-line, and a pair of differential bit-lines, or a generic split-control (GSC) 6T cell with three split-controlled power-supply lines, four split-controlled source-voltage lines, two split-controlled word-lines, and two split-accessed bit-lines.According to various embodiments, one or more SRAM cells may include three local drain power-supply assist-voltage nodes and a related assist-voltage generation means, such as a generator circuit, for driving local power-supply assist-voltage nodes to respectively generated power-supply assist-voltages, four local source assist-voltage nodes and a related assist-voltage generation means, such as a generator circuit, for driving local source assist-voltage nodes to respectively generated source assist-voltages, and two local word-line assist-voltage nodes and a related assist-voltage generation means, such as a generator circuit, for driving local word-line assist-voltage nodes to respectively generated word-line assist-voltages. For various embodiments, the generated source assist-voltages may increase read stability and reduce read-half-select disturb during a read operation, and may reduce current leakage during a hold and a standby (power-down) operations. For various embodiments, the generated power-supply assist-voltages may increase write margin during a write operation and/or may reduce current leakage during a hold or a standby (power-down) operation. For various embodiments, the generated word-line assist-voltages may decrease the read and rHS disturbs.For various embodiments, the read-assist schemes may include the generated source assist-voltages only for a GSC 6T cell or include the generated source assist-voltages and the generated word-line assist-voltages together for a differential 6T cell. For various embodiments, the write-assist schemes may include the generated power-supply and source assist-voltages for a GSC 6T cell or include the generated power-supply and source assist-voltages and the generated word-line assist-voltages together for a differential 6T cell. For various embodiments, the hold-assist schemes may include the generated source assist-voltages only for a GSC 6T cell and a differential 6T cell. For various embodiments, the standby-assist schemes may include the generated source assist-voltages only or may include the generated power-supply and source assist-voltages together for a GSC 6T cell and a differential 6T cell.Other features that are considered as characteristic for various embodiments of the present invention are set forth in the appended claims.